## Treatise on Materials Science and Technology, Volume 2; Volume 19, Part 1 |

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Page 6

where E is Young's modulus and v Poisson's ratio.f In this equation , deve is the lattice

where E is Young's modulus and v Poisson's ratio.f In this equation , deve is the lattice

**spacing**in the direction defined by y and \ ( see Fig . 1 ) and d , the interplanar**spacing**of the stress - free state .Page 68

Let a function Hm ( Y ) represent the fraction of the sampling plane of crystalline material with composition m diffracting with an average interplanar

Let a function Hm ( Y ) represent the fraction of the sampling plane of crystalline material with composition m diffracting with an average interplanar

**spacing**dm . The diffraction angle Om is given by Bragg's Law .Page 69

A second considers a system of connecting elements with a linear

A second considers a system of connecting elements with a linear

**spacing**increase ( see Figs . 3a and c ) . If nonuniform strain is insignificant , small subgrains of approximately uniform composition would give broadening due to only ...### What people are saying - Write a review

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### Contents

The Investigation of Composition | 63 |

Penetration Distance | 75 |

Choice of Binary System for Composition | 86 |

Copyright | |

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absorption addition allow alloy angle Appl applications atoms band bandgap beam broadening coefficients components composition concentration containing cooling cross section curve defects dependent deposits depth determined developed diffraction diffusion direction discussed dislocation distribution donor effect electron elements emission energy et al example excitation experimental factor field function give given heat hyperfine important impurities increasing intensity interaction iron laser lattice layer less magnetic material measurements Metals method Monemar Mössbauer neighbor observed obtained occur optical parameter peak phase Phys position possible powders problem produce properties range rays recently recombination region relative residual stress ribbon sample semiconductors shift shown solid spacing specimen spectra spectrum sputtering steel stress structure studies substrate surface target techniques temperature term thickness values variation volume X-ray